掃描穿透式電子顯微鏡

可選購的STEM 是一種分析工具，用於在台式 "掃描電子顯微鏡"（SEM）的基礎上，透過檢測電子槍產生的電子束以二維方式投射到試樣上的電子，產生透射影像。這種工具可以讓 "生命科學 "領域的學者利用其細小的盲文光束( braille beams)和豐富的亮度，觀察表面下的細胞訊息及其結構，以及材料科學領域的奈米結構。

應用

Optional product STEM is an analysis tool used to generate transmission images, on the basis of a table-top ‘Scanning Electron Microscope’ (SEM), by detecting electrons that had been projected onto a specimen in a two-dimensional manner through electron beams generated by an electron gun. This tool allows scholars in the ‘life sciences’ field to observe the information of cells beneath the surface and their structure and, in material science, nanostructures by using its small braille beams and rich luminance.

application