太陽能光伏相關設備 > 太陽能研究分析
LBIC-PL-EL 設定
Combined and Customized Laser Beam Induced Current, Photoluminescence and Electroluminescence Setups 型號：LBIC-PL-EL
Fast and reliable photocurrent mapping with highest resolution
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- Fast and reliable photocurrent mapping with highest resolution
- In-depth defect detection, visualization and identification – shunts, coating defects, localize inactive regions
- Study degradation effects
- Quality control tool
- A laser beam scans the sample and the excited photocurrent is measured and the spectrally resolved luminescence is simultaneously detected
- Electrical excitation for electroluminescence measurements
- Different (multiple) laser wavelengths available
- Up to 300×300 mm² scanning area
- Mapping of all kinds of solar technologies: Perovskite, Organic, Silicon, CIGS, CdTE,
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- Different laser choices
- Laser check for beam circularity
- Versatile sample holder
- Easy to use control software with data export
- Different detector options for luminescence measurements, optimized to application and budget
PL/EL Options
Art. No. Description PL PL Upgrade – high quality detector system optimized for each application from 200-1700 nm EL EL Upgrade (PL option required) FC Fiber bundle connector for using the detector system with other inputs