選擇品牌
- Neware
- Pine Research
- OKOndt Group
- Novocontrol
- Norecs
- METERTEST
- Microrad
- Metrel
- Labdex
- SDT
- micrux
- AARONIA AG
- ADASH
- Amptek
- AOiP
- AstroNova
- AWSensors
- Automatic Research
- BASI
- BRS
- Cmc
- CTRL
- CALMET
- CHECKLINE
- C-Tech
- DV Power
- DANATRONICS
- ECH
- Elsys
- Enervac
- Enapter
- ELVEFLOW
- EA Technology
- EL-CELL
- ENERGY SUPPORT
- Electrothermal
- FASTEC
- GE
- GMW
- Gaskatel
- GIUSSANI
- Globecore
- GREENLIGHT
- GRZ
- HTW
- HIGH SENSE SOLUTIONSHTW
- HUBER
- Labnics
- Ida
- LIQUID
- Instytut Fotonowy
- KEHUA TECH
- JGG
- HVPD
- Jenway
- Jacomex
- IVIUM
- ndb
- OZM
- Redoxme
- Serstech
- SATIR
- VacCoat
- Zurich
- Neware
- Pine Research
- OKOndt Group
- Novocontrol
- Norecs
- METERTEST
- Microrad
- Metrel
- Labdex
- SDT
- micrux
- AARONIA AG
- ADASH
- Amptek
- AOiP
- AstroNova
- AWSensors
- Automatic Research
- BASI
- BRS
- Cmc
- CTRL
- CALMET
- CHECKLINE
- C-Tech
- DV Power
- DANATRONICS
- ECH
- Elsys
- Enervac
- Enapter
- ELVEFLOW
- EA Technology
- EL-CELL
- ENERGY SUPPORT
- Electrothermal
- FASTEC
- GE
- GMW
- Gaskatel
- GIUSSANI
- Globecore
- GREENLIGHT
- GRZ
- HTW
- HIGH SENSE SOLUTIONSHTW
- HUBER
- Labnics
- Ida
- LIQUID
- Instytut Fotonowy
- KEHUA TECH
- JGG
- HVPD
- Jenway
- Jacomex
- IVIUM
- ndb
- OZM
- Redoxme
- Serstech
- SATIR
- VacCoat
- Zurich
- Neware
- Pine Research
- OKOndt Group
- Novocontrol
- Norecs
- METERTEST
- Microrad
- Metrel
- Labdex
- SDT
- micrux
- AARONIA AG
- ADASH
- Amptek
- AOiP
- AstroNova
- AWSensors
- Automatic Research
- BASI
- BRS
- Cmc
- CTRL
- CALMET
- CHECKLINE
- C-Tech
- DV Power
- DANATRONICS
- ECH
- Elsys
- Enervac
- Enapter
- ELVEFLOW
- EA Technology
- EL-CELL
- ENERGY SUPPORT
- Electrothermal
- FASTEC
- GE
- GMW
- Gaskatel
- GIUSSANI
- Globecore
- GREENLIGHT
- GRZ
- HTW
- HIGH SENSE SOLUTIONSHTW
- HUBER
- Labnics
- Ida
- LIQUID
- Instytut Fotonowy
- KEHUA TECH
- JGG
- HVPD
- Jenway
- Jacomex
- IVIUM
- ndb
- OZM
- Redoxme
- Serstech
- SATIR
- VacCoat
- Zurich
截面拋光機
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截面拋光機
Ion Beam PolisherCP-8000+CP-8000+ 是一種先進的樣品製備工具,可利用氬離子束蝕刻樣品的橫截面。 此過程可避免物理變形和結構損壞,而無需複雜的化學過程。 此外,該系統還能處理從幾十㎛到幾mm㎛的大面積樣品,從而簡化了樣品的橫斷面分析。加入諮詢加入諮詢