0 like search mail home
選擇品牌 arrow_down

表徵樣品測量設備

> Characterization sample measurement equipment
  • 瞬態測量單元(TMU)

    瞬態測量單元(TMU)

    Transient Measurement Unit (TMU)
    TMU
    ◎Semiconductor characterization
    ◎Measurement of every relevant solar cell parameter
    ◎Know your device limitations – Improve your devices
    ◎Study ageing behavior
    加入諮詢
    加入諮詢
  • IV測量單位

    IV測量單位

    IV Measurement Unit
    Software controlled switching between measurement modes and contacts
    加入諮詢
    加入諮詢
  • LBIC 設定

    LBIC 設定

    Customized Photocurrent Mapping of Solar Cells and Modules
    LBIC
    Laser choices
    ◎Standard: 445 nm wavelength, 10mW power
    ◎405 nm, 532 nm, and many more
    加入諮詢
    加入諮詢
  • LBIC-PL-EL 設定

    LBIC-PL-EL 設定

    Combined and Customized Laser Beam Induced Current, Photoluminescence and Electroluminescence Setups
    LBIC-PL-EL
    Fast and reliable photocurrent mapping with highest resolution
    加入諮詢
    加入諮詢
  • MPP 追蹤器

    MPP 追蹤器

    MPP Tracker
    MPP Tracker
    Tracking by adjusting electronic loads to the solar cell operating point
    加入諮詢
    加入諮詢
  • 激光圖案化ITO和FTO基板

    激光圖案化ITO和FTO基板

    Laser Patterned ITO and FTO Substrates
    Consumables
    High quality substrates for optoelectronic applications, i.e.
    加入諮詢
    加入諮詢