選擇品牌
- Neware
- Pine Research
- OKOndt Group
- Novocontrol
- Norecs
- METERTEST
- Microrad
- Metrel
- Labdex
- SDT
- micrux
- AARONIA AG
- ADASH
- Amptek
- AOiP
- AstroNova
- AWSensors
- Automatic Research
- BASI
- BRS
- Cmc
- CTRL
- CALMET
- CHECKLINE
- C-Tech
- DV Power
- DANATRONICS
- ECH
- Elsys
- Enervac
- Enapter
- ELVEFLOW
- EA Technology
- EL-CELL
- ENERGY SUPPORT
- Electrothermal
- FASTEC
- GE
- GMW
- Gaskatel
- GIUSSANI
- Globecore
- GREENLIGHT
- GRZ
- HTW
- HIGH SENSE SOLUTIONSHTW
- HUBER
- Labnics
- Ida
- LIQUID
- Instytut Fotonowy
- KEHUA TECH
- JGG
- HVPD
- Jenway
- Jacomex
- IVIUM
- ndb
- OZM
- Redoxme
- Serstech
- SATIR
- VacCoat
- Zurich
- Neware
- Pine Research
- OKOndt Group
- Novocontrol
- Norecs
- METERTEST
- Microrad
- Metrel
- Labdex
- SDT
- micrux
- AARONIA AG
- ADASH
- Amptek
- AOiP
- AstroNova
- AWSensors
- Automatic Research
- BASI
- BRS
- Cmc
- CTRL
- CALMET
- CHECKLINE
- C-Tech
- DV Power
- DANATRONICS
- ECH
- Elsys
- Enervac
- Enapter
- ELVEFLOW
- EA Technology
- EL-CELL
- ENERGY SUPPORT
- Electrothermal
- FASTEC
- GE
- GMW
- Gaskatel
- GIUSSANI
- Globecore
- GREENLIGHT
- GRZ
- HTW
- HIGH SENSE SOLUTIONSHTW
- HUBER
- Labnics
- Ida
- LIQUID
- Instytut Fotonowy
- KEHUA TECH
- JGG
- HVPD
- Jenway
- Jacomex
- IVIUM
- ndb
- OZM
- Redoxme
- Serstech
- SATIR
- VacCoat
- Zurich
- Neware
- Pine Research
- OKOndt Group
- Novocontrol
- Norecs
- METERTEST
- Microrad
- Metrel
- Labdex
- SDT
- micrux
- AARONIA AG
- ADASH
- Amptek
- AOiP
- AstroNova
- AWSensors
- Automatic Research
- BASI
- BRS
- Cmc
- CTRL
- CALMET
- CHECKLINE
- C-Tech
- DV Power
- DANATRONICS
- ECH
- Elsys
- Enervac
- Enapter
- ELVEFLOW
- EA Technology
- EL-CELL
- ENERGY SUPPORT
- Electrothermal
- FASTEC
- GE
- GMW
- Gaskatel
- GIUSSANI
- Globecore
- GREENLIGHT
- GRZ
- HTW
- HIGH SENSE SOLUTIONSHTW
- HUBER
- Labnics
- Ida
- LIQUID
- Instytut Fotonowy
- KEHUA TECH
- JGG
- HVPD
- Jenway
- Jacomex
- IVIUM
- ndb
- OZM
- Redoxme
- Serstech
- SATIR
- VacCoat
- Zurich
Automatic Research
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瞬態測量單元(TMU)
Transient Measurement Unit (TMU)TMU◎Semiconductor characterization
◎Measurement of every relevant solar cell parameter
◎Know your device limitations – Improve your devices
◎Study ageing behavior加入諮詢加入諮詢 -
IV測量單位
IV Measurement UnitSoftware controlled switching between measurement modes and contacts加入諮詢加入諮詢 -
LBIC 設定
Customized Photocurrent Mapping of Solar Cells and ModulesLBICLaser choices
◎Standard: 445 nm wavelength, 10mW power
◎405 nm, 532 nm, and many more加入諮詢加入諮詢 -
LBIC-PL-EL 設定
Combined and Customized Laser Beam Induced Current, Photoluminescence and Electroluminescence SetupsLBIC-PL-ELFast and reliable photocurrent mapping with highest resolution加入諮詢加入諮詢 -
MPP 追蹤器
MPP TrackerMPP TrackerTracking by adjusting electronic loads to the solar cell operating point加入諮詢加入諮詢 -
激光圖案化ITO和FTO基板
Laser Patterned ITO and FTO SubstratesConsumablesHigh quality substrates for optoelectronic applications, i.e.加入諮詢加入諮詢 -
薄膜塗佈機TFC200-400
Thin Film Coater TFC200-400TFC200-400Print functional films with nanometer precision加入諮詢加入諮詢 -
縫模塗佈器和塗佈頭
Slot-Die Applicators and Coating HeadsTransform a film applicator into a slot-die printer加入諮詢加入諮詢