選擇品牌
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Neware
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Pine Research
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OKOndt Group
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Novocontrol
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Norecs
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METERTEST
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Microrad
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Metrel
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Labdex
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SDT
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micrux
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AARONIA AG
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ADASH
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Amptek
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AOiP
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AstroNova
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AWSensors
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Automatic Research
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BASI
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BRS
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BWB Technologies
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Cmc
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CTRL
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CALMET
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CHECKLINE
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Coxem
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C-Tech
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DV Power
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DANATRONICS
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ECH
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Elsys
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Enervac
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Enapter
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ELVEFLOW
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EA Technology
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EL-CELL
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ENERGY SUPPORT
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Electrothermal
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FASTEC
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GE
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GMW
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Gaskatel
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GIUSSANI
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Globecore
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GREENLIGHT
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GRZ
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HTW
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HIGH SENSE SOLUTIONSHTW
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HUBER
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Labnics
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Ida
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LIQUID
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Instytut Fotonowy
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KEHUA TECH
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JGG
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HVPD
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Jenway
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Jacomex
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IVIUM
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ndb
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OZM
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Redoxme
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Serstech
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SATIR
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VacCoat
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Zurich
- Neware
- Pine Research
- OKOndt Group
- Novocontrol
- Norecs
- METERTEST
- Microrad
- Metrel
- Labdex
- SDT
- micrux
- AARONIA AG
- ADASH
- Amptek
- AOiP
- AstroNova
- AWSensors
- Automatic Research
- BASI
- BRS
- BWB Technologies
- Cmc
- CTRL
- CALMET
- CHECKLINE
- Coxem
- C-Tech
- DV Power
- DANATRONICS
- ECH
- Elsys
- Enervac
- Enapter
- ELVEFLOW
- EA Technology
- EL-CELL
- ENERGY SUPPORT
- Electrothermal
- FASTEC
- GE
- GMW
- Gaskatel
- GIUSSANI
- Globecore
- GREENLIGHT
- GRZ
- HTW
- HIGH SENSE SOLUTIONSHTW
- HUBER
- Labnics
- Ida
- LIQUID
- Instytut Fotonowy
- KEHUA TECH
- JGG
- HVPD
- Jenway
- Jacomex
- IVIUM
- ndb
- OZM
- Redoxme
- Serstech
- SATIR
- VacCoat
- Zurich
LBIC-PL-EL 設定
Combined and Customized Laser Beam Induced Current, Photoluminescence and Electroluminescence Setups 型號：LBIC-PL-EL
Fast and reliable photocurrent mapping with highest resolution
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- Fast and reliable photocurrent mapping with highest resolution
- In-depth defect detection, visualization and identification – shunts, coating defects, localize inactive regions
- Study degradation effects
- Quality control tool
- A laser beam scans the sample and the excited photocurrent is measured and the spectrally resolved luminescence is simultaneously detected
- Electrical excitation for electroluminescence measurements
- Different (multiple) laser wavelengths available
- Up to 300×300 mm² scanning area
- Mapping of all kinds of solar technologies: Perovskite, Organic, Silicon, CIGS, CdTE,
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- Different laser choices
- Laser check for beam circularity
- Versatile sample holder
- Easy to use control software with data export
- Different detector options for luminescence measurements, optimized to application and budget
PL/EL Options
Art. No. Description PL PL Upgrade – high quality detector system optimized for each application from 200-1700 nm EL EL Upgrade (PL option required) FC Fiber bundle connector for using the detector system with other inputs