選擇品牌
- Neware
- Pine Research
- OKOndt Group
- Novocontrol
- Norecs
- METERTEST
- Microrad
- Metrel
- Labdex
- SDT
- micrux
- AARONIA AG
- ADASH
- Amptek
- AOiP
- AstroNova
- AWSensors
- Automatic Research
- BASI
- BRS
- BWB Technologies
- Cmc
- CTRL
- CALMET
- CHECKLINE
- Coxem
- C-Tech
- DV Power
- DANATRONICS
- ECH
- Elsys
- Enervac
- Enapter
- ELVEFLOW
- EA Technology
- EL-CELL
- ENERGY SUPPORT
- Electrothermal
- FASTEC
- GE
- GMW
- Gaskatel
- GIUSSANI
- Globecore
- GREENLIGHT
- GRZ
- HTW
- HIGH SENSE SOLUTIONSHTW
- HUBER
- Labnics
- Ida
- LIQUID
- Instytut Fotonowy
- KEHUA TECH
- JGG
- HVPD
- Jenway
- Jacomex
- IVIUM
- ndb
- OZM
- Redoxme
- Serstech
- SATIR
- VacCoat
- Zurich
- Neware
- Pine Research
- OKOndt Group
- Novocontrol
- Norecs
- METERTEST
- Microrad
- Metrel
- Labdex
- SDT
- micrux
- AARONIA AG
- ADASH
- Amptek
- AOiP
- AstroNova
- AWSensors
- Automatic Research
- BASI
- BRS
- BWB Technologies
- Cmc
- CTRL
- CALMET
- CHECKLINE
- Coxem
- C-Tech
- DV Power
- DANATRONICS
- ECH
- Elsys
- Enervac
- Enapter
- ELVEFLOW
- EA Technology
- EL-CELL
- ENERGY SUPPORT
- Electrothermal
- FASTEC
- GE
- GMW
- Gaskatel
- GIUSSANI
- Globecore
- GREENLIGHT
- GRZ
- HTW
- HIGH SENSE SOLUTIONSHTW
- HUBER
- Labnics
- Ida
- LIQUID
- Instytut Fotonowy
- KEHUA TECH
- JGG
- HVPD
- Jenway
- Jacomex
- IVIUM
- ndb
- OZM
- Redoxme
- Serstech
- SATIR
- VacCoat
- Zurich
LBIC 設定
Customized Photocurrent Mapping of Solar Cells and Modules 型號:LBIC
Laser choices
◎Standard: 445 nm wavelength, 10mW power
◎405 nm, 532 nm, and many more
◎Standard: 445 nm wavelength, 10mW power
◎405 nm, 532 nm, and many more
-
- Laser choices
- Standard: 445 nm wavelength, 10mW power
- 405 nm, 532 nm, and many more
- Laser checked for beam circularity
- Sample holder:
- Versatile and adaptable to a large range of sample layouts
- Multiplexer option for automatic contact switching
- Current amplifier for low signal measurements
- Easy to use control software with data export
- Laser choices
-
Applications and functions
- Fast and reliable photocurrent mapping with highest resolution
- Defect detection and visualization – shunts, coating defects, localize inactive regions
- Study degradation effects
- Quality control tool
- A laser beam scans the sample and the excited photocurrent is measured
- Different (multiple) laser wavelengths available
- Up to 300×300 mm² scanning area
- Mapping of all kinds of solar technologies: Perovskite, Organic, Silicon, CIGS, CdTe,