FAST SDD® 和 C2 視窗的 EDS（SEM）應用

Amptek 很自豪地為掃描電子顯微鏡（SEMs）中的能量散射X射線譜（EDS）推出了一款改進的矽漂移探測器（SDD）。 使用Amptek專有的專利“C 系列”氮化矽（Si3N4）X 射線視窗，Amptek FAST SDD的低能量回應可擴展到鈹（Be）。 具有高固有效率的FAST SDD是EDS的理想選擇，EDS也被稱為能量散射X射線譜測量（EDX 或 XEDS）和能量散射X射線分析（EDXA）或 能量散射X射線微量分析（EDXMA）。

系統包括：

• FAST SDD® – 225 mm 或 270 mm
• 帶數位脈衝處理器和所有電源的 X-123 封裝
• 真空延長管 – 5 或 9 英寸
• 真空法蘭

圖 1.帶 C2 視窗、真空延長管和饋通接頭的 X-123 FAST SDD® 光譜儀。
 

圖2 .鈹 （Be） 和碳 （C） 光譜，帶有 C2 視窗的新型快速 SDD® 探測器。

圖 3.C2 視窗與聚合物視窗。

圖 4.FAST SDD® 55Fe 光譜。

*本頁上的所有結果都是完全冷卻時的典型性能值; 請聯繫我們以討論在不同工作條件下的保證性能。 參數如有變更，恕不另行通知。 C2 視窗對 He 不氣密。 切勿將其放到 He 淨化（吹掃）氣體中。 這將破壞真空並使保固失效。

Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary Patented “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).

Systems include:

• FAST SDD® – 225 mm or 270 mm
• X-123 package with digital pulse processor and all power supplies
• Vacuum extender – 5 or 9 inches
• Vacuum flange 

Figure 1. The X-123 FAST SDD® spectrometer with C2 window, vacuum extender, and feedthrough coupling.
 

Figure 3. Beryllium (Be) and Carbon (C) spectrum with new Fast SDD® detector with C2 Window.
 

Figure 3. C2 Window vs. polymer window.
 

Figure 4. FAST SDD® 55Fe Spectrum.
*All results on this page are typical performance values at full cooling; please Contact Us to discuss guaranteed performance under different operating conditions.  Specifications subject to change without notice. The C2 window is NOT He tight. Do not put it in He purge. It will destroy the vacuum and void warranty.